Calculate optical thickness from index, thickness, wavelength, and angle. Review quarter-wave and half-wave targets instantly. Visualize trends, save data, and study coating behavior easily.
Here, n is film refractive index, d is physical thickness, λ is vacuum wavelength, θᵢ is incident angle, and θₜ is the transmitted angle inside the film.
| Case | n₀ | n | d (nm) | λ (nm) | θᵢ (°) | Optical Thickness (nm) | Phase Thickness (rad) | Quarter-Wave d (nm) |
|---|---|---|---|---|---|---|---|---|
| Visible coating, normal incidence | 1.00 | 1.50 | 100 | 550 | 0 | 150.000 | 1.714 | 91.667 |
| High-index film at 30° | 1.00 | 2.10 | 120 | 633 | 30 | 244.773 | 2.429 | 77.604 |
| Infrared film at 45° | 1.00 | 1.38 | 250 | 1550 | 45 | 296.300 | 1.201 | 326.999 |
Optical thickness is the effective distance light experiences inside a film. It equals refractive index multiplied by physical thickness and the cosine of the transmitted angle for oblique incidence.
At nonzero incidence, light travels a different effective path through the coating. The internal angle changes the cosine term, so optical thickness and phase thickness both shift.
Physical thickness is the actual coating depth. Optical thickness includes refractive index and angle effects, so it reflects how the wave accumulates phase inside the film.
Quarter-wave films are widely used in antireflection and interference coatings. They often create useful phase conditions that reduce reflection or shift reflected light relative to the substrate.
Yes. This calculator accepts nm, µm, and mm for thickness and wavelength. It internally converts values for consistent physics calculations, then returns thickness-based outputs in your selected thickness unit.
If the incident-medium index is higher than the film index and the angle is too large, Snell’s law gives no real transmitted angle. The calculator warns you when this condition appears.
Wave count is optical thickness divided by wavelength. It tells you how many wavelengths fit into the one-way optical path through the film at the chosen operating condition.
Yes, it is useful for checking individual layer behavior. For full multilayer stacks, you would also need interface phase changes, substrate properties, and matrix-based reflectance calculations.
Important Note: All the Calculators listed in this site are for educational purpose only and we do not guarentee the accuracy of results. Please do consult with other sources as well.